Defect Contour Detection of Complex Structural Chips
نویسندگان
چکیده
In the manufacture of chips, it is important to detect defects assess whether chip potentially damageable that could cause unnecessary cost. Most assessment rules are set in light characteristics determined by defect contours, such as area and range. However, conventional image process methods seldom show a satisfactory performance on chips with complex structures because they difficult distinguish contours from edges structures. To solve this issue, study proposes method based region segmentation search. The positions calculated edge matching obtain number structure layers each pixel. Regions whose pixels have same divided into subregions which coded two-pass algorithm. subregion then extracted Canny operator construct information whole image. Interpolation used correct incomplete according their endpoints. remaining interference eliminated basis shapes. A certain kind presented. Different illumination situations were simulated verify robustness proposed method. bubbles images detected successfully accurately. Because this, more than 92% results identical ones reality engineering, proves can efficiently improve ability obviously relative current approaches.
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ژورنال
عنوان ژورنال: Mathematical Problems in Engineering
سال: 2021
ISSN: ['1026-7077', '1563-5147', '1024-123X']
DOI: https://doi.org/10.1155/2021/5518675